परिचय

SAIF Organizes regular training programs, workshops and symposia on Electron Microscopy for manpower development. These are as follows:

A         National training programs

(a)  For technical personnel

This training programme is conducted during January/February every alternate year and is of 2-week duration.  Training is imparted in the maintenance and operation of electron microscopes and other ancillary equipment.  The trainees are also given training on sample preparation, ultrathin sectioning and grid preparation for TEM and sample preparation, critical point drying and sputter coating for SEM.

(b)  For scientific investigators

This training programme is conducted during October/November each year and is of 2-week duration.  The first half is devoted to basic course and the second half is for the advance techniques. In the basic course, theoretical and practical aspects of electron microscopy, such as principles of operation, use and maintenance of electron microscopes and specimen preparation are included.  In the advanced course, training is imparted on special techniques like immuno-electron microscopy, stereology and image analysis.

(c)   Summer training

A six-week extensive hands-on training on sample preparation and operation of both SEM and TEM is held every year tentatively from 15th May for a period of six weeks.  The objective of the training program is to enhance the skills of technical support staff for an electron microscope Laboratory.

Procedure for applications for training programs

Applications are invited from eligible candidates as per the details appearing in the announcement, which is advertised in “Employment News” and “Current Science”, in June/July each year. The details of the announcement can also be obtained through e-mail “ यह ईमेल पता spambots से संरक्षित किया जा रहा है. आप जावास्क्रिप्ट यह देखने के सक्षम होना चाहिए. , in the month of June.

A Committee scrutinizes the applications and the selected candidates are intimated to join the training.

The application should be sent to:

Officer-in-Charge, E.M. Facility, Department of Anatomy, AIIMS, New Delhi  110 029.

The aim of SAIF-AIIMS is to strive for excellence and ensure maximal utilization of the national resource.

The facility is committed to

• Provide assistance to research on electron microscopy by investigators,

• Provide expertise for the use of equipment, interpretation and evaluation of ultrastructural data,

• Develop new techniques in ultrastructural research to facilitate scientists working in the front-line areas of research and

• Organize regular training programs, workshops and symposia on Electron Microscopy for manpower development.

Faculty members

Technical staff

Sandeep Arya, Technical Officer

Chanda Panwar, Lab Technician

Anurag Singh, Lab Technician

Madan Mohan Sharma, Lab Technician

Meherban Singh, Lab Technician

Raj Girish Mishra, Lab Attendant II

Non-technical staff  :-

Manjeet Kapoor, Private Secretary

Sudhir Srivastava, Upper Division Clerk (Stores)