Aims and Objectives
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The aim of SAIF-AIIMS is to strive for excellence and ensure maximal utilization of the national resource.
The facility is committed to
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Provide assistance to research on electron microscopy by investigators,
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Provide expertise for the use of equipment, interpretation and evaluation of ultrastructural data,
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Develop new techniques in ultrastructural research to facilitate scientists working in the front-line areas of research and
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Organize regular training programs, workshops and symposia on Electron Microscopy for manpower development.
